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- Gabriele Arcidiacono, G. Marconi University, Italy
- Efrén Benavides, UPM, Spain
- Christopher A. Brown, Worcester Polytechnic Institute, USA
- Miguel Cavique, Escola Naval, Portugal
- Wei Chen, Xi’an Jiaotong University, China
- Paolo Citti, Marconi University, Italy
- David Cochran, PFW, USA
- Hrishikesh Deo, Pentax Medical, USA
- Sung Hee Do, Axiomatic Design Solutions, Inc., USA
- Oana Dodun, TU of Ia?i, România
- Petru Du?a, TU of Ia?i, România
- Basem El-Haik, Six Sigma Professionals, Inc., USA
- Joseph Timothy Foley, Reykjavik University, Iceland
- Alessandro Giorgetti, G. Marconi University, Italy
- António M. Gonçalves-Coelho, FCT/Universidade Nova de Lisboa, Portugal
- Sang-Gook Kim, MIT, USA
- Torsten Kjellberg, KTH, Royal Institute of Technology, Sweden
- Dai Gil Lee, KAIST, Korea
- Taesik Lee, KAIST, Korea
- Ang Liu, University of New South Wales, Australia
- Stephen Lu, University of Southern California, USA
- Luc Mathieu, LURPA ENS Cachan, France
- Dominik Matt, University of Bolzano, Italy
- James Morrison, KAIST, Korea
- António Mourão, FCT/Universidade Nova de Lisboa, Portugal
- Masayuki Nakao, University of Tokyo, Japan
- Andrew Nee, National University of Singapore
- Hilario Oh, MIT, USA
- Greg B. Olson, QuesTek Innovations LLC, USA
- Soh Khim Ong, National University of Singapore
- Matt Pallaver, Schlumberger, USA
- Gyung Jin Park, Hanyang University, Korea
- Joan B. R. Pastor, Altran, Spain
- Erik Puik, HU University of Applied Sciences Utrecht, Nederland
- Moshe Shpitalni, Technion, Israel
- Lauren?iu Sl?tineanu, TU of Ia?i, România
- Nam P. Suh, MIT, USA
- Derrick Tate, Xi’an Jiaotong-Liverpool University, China
- Mary Kathryn Thompson, Danmarks Tekniske Universitet, Denmark
- Mitchel Tseng, HKUST, Hong Kong
- Aurelian Vadean, Polytechnique Montréal, Canada
- Tom Vaneker, University of Twente, Nederlands
- Youbai Xie, Jiao Tong University, China
- Jakob WEBER, Daimler AG, Germany