Scientific Committee

  • Gabriele Arcidiacono,  G. Marconi University, Italy
  • Efrén BenavidesUPM, Spain
  • Christopher A. Brown,  Worcester Polytechnic Institute, USA
  • Miguel Cavique,  Escola Naval, Portugal
  • Wei Chen,  Xi’an Jiaotong University, China
  • Paolo CittiMarconi University, Italy
  • David Cochran,  PFW, USA
  • Hrishikesh Deo,  Pentax Medical, USA
  • Sung Hee Do,   Axiomatic Design Solutions, Inc., USA
  • Oana Dodun,   TU of Iaşi, România
  • Petru Dușa,  TU of Iaşi, România
  • Basem El-Haik,  Six Sigma Professionals, Inc., USA
  • Joseph Timothy Foley,  Reykjavik University, Iceland
  • Alessandro Giorgetti,  G. Marconi University, Italy
  • António M. Gonçalves-Coelho, FCT/Universidade Nova de Lisboa, Portugal
  • Sang-Gook Kim,  MIT, USA
  • Torsten Kjellberg,  KTH, Royal Institute of Technology, Sweden
  • Dai Gil LeeKAIST, Korea
  • Taesik LeeKAIST, Korea
  • Ang Liu,  University of New South Wales, Australia
  • Stephen Lu,  University of Southern California, USA
  • Luc MathieuLURPA ENS Cachan, France
  • Dominik Matt,  University of Bolzano, Italy
  • James Morrison,  KAIST, Korea
  • António Mourão,  FCT/Universidade Nova de Lisboa, Portugal
  • Masayuki Nakao,  University of Tokyo, Japan
  • Andrew NeeNational University of Singapore
  • Hilario Oh,  MIT, USA
  • Greg B. Olson,  QuesTek Innovations LLC, USA
  • Soh Khim Ong,  National University of Singapore
  • Matt Pallaver,  Schlumberger, USA
  • Gyung Jin Park,  Hanyang University, Korea
  • Joan B. R. PastorAltran, Spain
  • Erik PuikHU University of Applied Sciences Utrecht, Nederland
  • Moshe ShpitalniTechnion, Israel
  • Laurențiu SlătineanuTU of Iaşi, România
  • Nam P. SuhMIT, USA
  • Derrick TateXi’an Jiaotong-Liverpool University, China
  • Mary Kathryn ThompsonDanmarks Tekniske Universitet, Denmark
  • Mitchel Tseng,  HKUST, Hong Kong
  • Aurelian VadeanPolytechnique Montréal, Canada
  • Tom Vaneker,  University of Twente, Nederlands
  • Youbai XieJiao Tong University, China
  • Jakob WEBER,  Daimler AG, Germany